| タイトル | Modeling defect trends for iterative development |
| 著者（英） | Powell, J. D.; Spanguolo, J. N. |
| 発行日 | 2003-06-17 |
| 言語 | eng |
| 内容記述 | The Employment of Defects (EoD) approach to measuring and analyzing defects seeks to identify and capture trends and phenomena that are critical to managing software quality in the iterative software development lifecycle at JPL. |
| 権利 | Copyright |
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