タイトル | SIM astrometric demonstration at the 150 picometer level using the MAM testbed |
著者(英) | Bloemhof, E. E.; Bell, C. E.; Goullioud, R.; Hines, B. E.; Shen, T. J. |
発行日 | 2003-03-15 |
言語 | eng |
内容記述 | This paper describes the MAM optical setup, the alignment process, the current data and how the performance relates to SIM. |
権利 | Copyright |
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