| タイトル | Buried Oxide Densification for Low Power, Low Voltage CMOS Applications |
| 著者（英） | Dolan, B.; Jenkins, W.; Anc, M. J.; Guss, B.; Jiao, J.; Liu, S. T.; Allen, L. P.; Seraphin, S. |
| 著者所属（英） | Ibis Technology Corp. |
| 発行日 | 1998-01-01
1998 |
| 言語 | eng |
| 内容記述 | Special technology and circuit architecture are of growing interest for implementation of circuits which operate at low supply voltages and consume low power levels without sacrificing performance[1]. Use of thin buried oxide SOI substrates is a primary approach to simultaneously achieve these goals. A significant aspect regarding SIMOX SOI for low voltage, low power applications is the reliability and performance of the thin buried oxide. In addition, when subjected to high total dose irradiation, the silicon islands within the BOX layer of SIMOX can store charges and significantly effect the back channel threshold voltages of devices. Thus, elimination of the islands within the buried oxide (BOX) layer is preferred in order to prevent leakage through these conductive islands and charge build-up within the buried oxide layer. A differential (2-step) ramp rate as applied to full and 100 nm BOX SIMOX was previously reported to play a significant role in the stoichiometry and island formation within the buried layer[2]. This paper focus is on the properties of a thin (120nm) buried oxide as a function of the anneal ramp rate and the temperature of anneal. In this research, we have found an improvement in the buried oxide stoichiometry with the use of a slower, singular ramp rate for specified thin buried oxides, with slower ramp rates and higher temperatures of anneal suggested for reducing the presence of Si islands within the BOX layer. |
| NASA分類 | Electronics and Electrical Engineering |
| 権利 | No Copyright |
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