| タイトル | Modeling contamination migration on the Chandra X-Ray Observatory |
| 著者（英） | Swartz, Douglas A.; Morris, Peter A.; Giordano, Rino J.; Tice, Neil W.; Chen, Kenny C.; Anderson, Scot K.; Plucinsky, Paul P.; O'Dell, Stephen L.; Tran, Hien; Knollenberg, Perry J. |
| 著者所属（英） | NASA Marshall Space Flight Center |
| 発行日 | 2005-01-01 |
| 言語 | eng |
| 内容記述 | During its first 5 years of operation, the cold (-60 C) optical blocking filter of the Advanced CCD Imaging Spectrometer (ACIS), on board the Chandra X-ray Observatory, has accumulated a contaminating layer that attenuates the low-energy x rays. To assist in assessing the likelihood of successfully baking off the contaminant, members of the Chandra Team developed contamination-migration simulation software. The simulation follows deposition onto and (temperature-dependent) vaporization from surfaces comprising a geometrical model of the Observatory. A separate thermal analysis, augmented by on-board temperature monitoring, provides temperatures for each surface of the same geometrical model. This paper describes the physical basis for the simulations, the methodologies, and the predicted migration of the contaminant for various bake-out scenarios and assumptions. |
| NASA分類 | Astrophysics |
| 権利 | No Copyright |
|
