| タイトル | Cryogenic System for Interferometry of High-precision Optics at 20 K: Design and Performance |
| 著者（英） | Davila, Pamela; Chrzanowski, Chris; Content, David; Chambers, John; Blake,Peter; Shirgur, Badri; Robinson, F. David; Frohlich, chip; Mink, Ronald G. |
| 著者所属（英） | NASA Goddard Space Flight Center |
| 発行日 | 2005-01-01 |
| 言語 | eng |
| 内容記述 | This report describes the facility and experimental methods at the Goddard Space Flight Center Optics Branch for the measurement of the surface figure of cryogenically-cooled spherical mirrors using standard phase-shifting interferometry, with a standard uncertainty below 2nm rms. Two developmental silicon carbide mirrors were tested: both were spheres with radius of curvature of 600 mm, and clear apertures of 150 mm. The mirrors were cooled within a cryostat, and the surface figure error measured through a fused-silica window. The GSFC team developed methods to measure the in-situ SFE at 20 K with a combined standard uncertainty below 2 nm rms and the change in SFE with temperature (the cryochange) with a combined standard uncertainty of 0.25 -- 0.75 nm rms. This paper will present the measurement facility, methods, and uncertainty analysis. |
| NASA分類 | Lunar and Planetary Science and Exploration |
| レポートNO | AS04-AS08-65
SPIE Paper-5904-29 |
| 権利 | No Copyright |
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