| タイトル | Intrinsic Line Shape Measurements of the XRS Instrument on Astro-E2 |
| 著者（英） | Porter, F. Scott |
| 著者所属（英） | NASA Goddard Space Flight Center |
| 発行日 | 2004-01-01 |
| 言語 | eng |
| 内容記述 | The XRS instrument on the Astro-E2 observatory contains a substantially improved microcalorimeter array over the Astro-E mission. In addition to roughly a factor of 2 improvement in the detector resolution at 6 keV, the detector response is shown to be almost perfectly gaussian. We have made measurements of the detector response of the flight instrument, using a double crystal monochrometer at 4 and 8 keV, a 55-Fe internal conversion source, and x-ray induced fluorescence from a number of targets including Ti, Cu, and GaAs. The detector response has been measured to be entirely gaussian to at least 2 orders of magnitude down from the peak of the line or line complex. This is in sharp contrast to the results from the XRS on Astro-E where many channels exhibited excess counts on the high energy side of the spectral lines. Here we present details of the line shape measurement as well as the detector response as measured during the XRS ground calibration including details of the line fits and line models. |
| NASA分類 | Instrumentation and Photography |
| 権利 | No Copyright |
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