| タイトル | A Rapid Turnaround Cryogenic Detector Characterization System |
| 著者（英） | Benford, Dominic j.; Dipirro, Michael J.; Forgione, Joshua B.; Shirron, Peter J.; Jackson, Clifton E.; Kogut, Al; Jackson, Michael L.; Moseley, S. Harvey |
| 著者所属（英） | NASA Goddard Space Flight Center |
| 発行日 | 2004-01-01 |
| 言語 | eng |
| 内容記述 | Upcoming major NASA missions such as the Einstein Inflation Probe and the Single Aperture Far-Infrared Observatory require arrays of detectors with thousands of elements, operating at temperatures near l00 mK and sensitive to wavelengths from approx. 100 microns to approx. 3 mm. Such detectors represent a substantial enabling technology for these missions, and must be demonstrated soon in order for them to proceed. In order to make rapid progress on detector development, the cryogenic testing cycle must be made convenient and quick. We have developed a cryogenic detector characterization system capable of testing superconducting detector arrays in formats up to 8 x 32, read out by SQUID multiplexers. The system relies on the cooling of a two-stage adiabatic demagnetization refrigerator immersed in a liquid helium bath. This approach permits a detector to be cooled from 300K to 50 mK in about 4 hours, so that a test cycle begun in the morning will be over by the end of the day. Tine system is modular, with two identical immersible units, so that while one unit is cooling, the second can be reconfigured for the next battery of tests. We describe the design, construction, and performance of this cryogenic detector testing facility. |
| NASA分類 | Fluid Mechanics and Thermodynamics |
| 権利 | No Copyright |
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