| タイトル | Optical Metrology for the Segmented Optics on the Constellation-X Spectroscopy X-Ray Telescope |
| 著者（英） | Fleetwood, Charles; Hadjimichael, Theo; Colella, David; Zhang, William; Content, David; Lehan, John; Reid, Paul; Saha, Timo; McMann, Joseph; Wright, Geraldine |
| 著者所属（英） | NASA Goddard Space Flight Center |
| 発行日 | 2004-01-01 |
| 言語 | eng |
| 内容記述 | We present the metrology requirements and metrology implementation necessary to prove out the reflector technology for the Constellation X(C-X) spectroscopy X-ray telescope (SXT). This segmented, 1.6m diameter highly nested Wolter-1 telescope presents many metrology and alignment challenges. In particular, these mirrors have a stringent imaging error budget as compared to their intrinsic stiffness; This is required for Constellation-X to have sufficient effective area with the weight requirement. This has implications for the metrology that can be used. A variety of contract and noncontact optical profiling and interferometric methods are combined to test the formed glass substrates before replication and the replicated reflector segments.The reflectors are tested both stand-alone and in-situ in an alignment tower.Some of these methods have not been used on prior X-ray telescopes and some are feasible only because of the segmented approach used on the SXT. Methods discussed include high precision coordinate measurement machines using very low force or optical probe axial interferometric profiling azimuthal circularity profiling and use of advanced null optics such as conical computer generated hologram (CGHs). |
| NASA分類 | Optics |
| 権利 | No Copyright |
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