| タイトル | A Dry-Etch Process for Low Temperature Superconducting Transition Edge Sensors for Far Infrared Bolometer Arrays |
| 著者（英） | Staguhn, Johannes; Stevenson, Thomas R.; Chervenak, James A.; McClanahan, Richard A.; Allen, Christine A.; Moseley, S. Harvey; Hsieh, Wen-Ting; Mitchell, Robert; Miller, Timothy M. |
| 著者所属（英） | NASA Goddard Space Flight Center |
| 発行日 | 2003-01-01 |
| 言語 | eng |
| 内容記述 | The next generation of ultra-low power bolometer arrays, with applications in far infrared imaging, spectroscopy and polarimetry, utilizes a superconducting bilayer as the sensing element to enable SQUID multiplexed readout. Superconducting transition edge sensors (TES s) are being produced with dual metal systems of superconductinghormal bilayers. The transition temperature (Tc) is tuned by altering the relative thickness of the superconductor with respect to the normal layer. We are currently investigating MoAu and MoCu bilayers. We have developed a dry-etching process for MoAu TES s with integrated molybdenum leads, and are working on adapting the process to MoCu. Dry etching has the advantage over wet etching in the MoAu system in that one can achieve a high degree of selectivity, greater than 10, using argon ME, or argon ion milling, for patterning gold on molybdenum. Molybdenum leads are subsequently patterned using fluorine plasma.. The dry-etch technique results in a smooth, featureless TES with sharp sidewalls, no undercutting of the Mo beneath the normal metal, and Mo leads with high critical current. The effects of individual processing parameters on the characteristics of the transition will be reported. |
| NASA分類 | Metals and Metallic Materials |
| 権利 | No Copyright |
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