| タイトル | High Accuracy Thermal Expansion Measurement at Cryogenic Temperatures |
| 著者（英） | Nein, Max; Presson, Joan; Tucker, Jim; Stallcup, Michael; Despit, Gregory |
| 著者所属（英） | NASA Marshall Space Flight Center |
| 発行日 | 2003-01-01 |
| 言語 | eng |
| 内容記述 | A new, interferometer-based system for measuring thermal expansion to an absolute accuracy of 20 ppb or better at cryogenic temperatures has been developed. Data from NIST Copper SRM 736 measured from room temperature to 15 K will be presented along with data from many other materials including beryllium, ULE, Zerodur, and composite materials. Particular attention will be given to a study by the Space Optics Manufacturing Technology Center (SOMTC) investigating the variability of ULE and beryllium materials used in the AMSD program Approximately 20 samples of each material, tested from room temperature to below 30 K are compared as a function of billet location. |
| NASA分類 | Fluid Mechanics and Thermodynamics |
| 権利 | Copyright |
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