| タイトル | Determination Of LETs Of SRAMs By Use Of A Laser |
| 著者（英） | Kim, Quiesup; Coss, James R.; Barnes, Charles E.; Mccarty, Kenneth P.; Schwartz, Harvey R. |
| 著者所属（英） | Jet Propulsion Lab., California Inst. of Tech. |
| 発行日 | 1995-11-01 |
| 言語 | eng |
| 内容記述 | Report describes experimental study of use of microelectronic advanced laser scanner (MEALS) to cause single-event upsets (SEUs) in integrated logic circuits. Basic concepts of SEU testing by use of MEALS described in "Laser Scanner Tests for Single-Event Upsets" (NPO-18216), "Single-Event-Upset Laser Scanner With Optical Bias" (NPO-18217), and "More About Laser Scanner Tests for Single-Event Upsets" (NPO-18494). Study part of continuing effort to study SEU effects of ionizing radiation on such circuits and to use MEALS as relatively inexpensive SEU-prescreening laboratory apparatus serving as alternative to heavy-ion acclerator. |
| NASA分類 | PHYSICAL SCIENCES |
| レポートNO | 95B10595
NPO-19315 |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/305485 |
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