タイトル | Optoelectronic Instruments For Analysis Of Surface Defects |
著者(英) | Hallberg, Carl G.; Mueller, Robert P.; Davis, Richard M.; Collins, J. David; Thayer, Stephen W.; Gleman, Stuart M.; Thompson, David L.; Thompson, James E. |
著者所属(英) | NASA Kennedy Space Center |
発行日 | 1995-02-01 |
言語 | eng |
内容記述 | Family of portable optoelectronic instruments developed to facilitate inspection of surface flaws like gouges, scratches, raised metal, and dents on large metal workpieces subject to surface-finish requirements. Instrument brought to workpiece and semiautomatically makes electronic record of three-dimensional shape of flaw. Entire inspection process takes only minutes. Prototype instrument includes structured-light microscope. Concept involves projection of known pattern of light onto surface inspected. Topography of surface determined from distortion of pattern as viewed through instrument. |
NASA分類 | ELECTRONIC SYSTEMS |
レポートNO | 95B10089 KSC-11686 |
権利 | No Copyright |
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