| タイトル | Optoelectronic Instruments For Analysis Of Surface Defects |
| 著者（英） | Hallberg, Carl G.; Mueller, Robert P.; Davis, Richard M.; Collins, J. David; Thayer, Stephen W.; Gleman, Stuart M.; Thompson, David L.; Thompson, James E. |
| 著者所属（英） | NASA Kennedy Space Center |
| 発行日 | 1995-02-01 |
| 言語 | eng |
| 内容記述 | Family of portable optoelectronic instruments developed to facilitate inspection of surface flaws like gouges, scratches, raised metal, and dents on large metal workpieces subject to surface-finish requirements. Instrument brought to workpiece and semiautomatically makes electronic record of three-dimensional shape of flaw. Entire inspection process takes only minutes. Prototype instrument includes structured-light microscope. Concept involves projection of known pattern of light onto surface inspected. Topography of surface determined from distortion of pattern as viewed through instrument. |
| NASA分類 | ELECTRONIC SYSTEMS |
| レポートNO | 95B10089
KSC-11686 |
| 権利 | No Copyright |
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