| タイトル | Optical and structural characterization of InAs/GaAs quantum wells |
| 著者（英） | Rich, D. H.; George, T.; Liu, J. K.; Terhune, R. W.; Grunthaner, F. J.; Huang, Y.-S.; Ksendzov, A.; Pollak, F. H.; Wilson, B. A. |
| 著者所属（英） | NASA Headquarters; Jet Propulsion Lab., California Inst. of Tech. |
| 発行日 | 1991-01-01
1991 |
| 言語 | eng |
| 内容記述 | Three InAs/GaAs single quantum wells of two-, three-, and four-monolayer thickness were characterized using optical and structural techniques. The results of high-resolution transmission electron (HRTEM) microscopy and optical studies which combine absorption, photoluminescence (PL), photoreflectance, and cathodoluminescence are presented. Using the polarization modulated absorptance technique, we observed two absorption features in our samples at 77 K. On the basis of their polarization properties and comparison with an envelope function calculation, these structures are assigned to transitions between the confined heavy-hole and confined and unconfined electron levels. Photoreflectance spectra of the three-monolayer sample in 77-300 K range show only the fundamental quantum well transition. The temperature dependence of this transition is approximately linear with a slope of 2.2 x 10 exp -4 eV/K, which is significantly lower than in both constituent materials. Comparison to the absorption data reveals that the PL spectra are affected by the carrier diffusion and therefore do not provide direct measure of the exciton density of states. The HRTEM images indicate that, while the interfaces of the two-monolayer sample are smooth and the well thickness is uniform, the four-monolayer sample has uneven interfaces and contains domains of two, three, and four monolayers. |
| NASA分類 | SOLID-STATE PHYSICS |
| レポートNO | 93A54886 |
| 権利 | Copyright |
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