| タイトル | Scanning Tunneling Microscopy analysis of space-exposed polymer films |
| 著者（英） | Kalil, Carol R.; Young, Philip R. |
| 著者所属（英） | NASA Langley Research Center |
| 発行日 | 1993-01-01
1993 |
| 言語 | eng |
| 内容記述 | The characterization of the surface of selected space-exposed polymer films by Scanning Tunneling Microscopy (STM) is reported. Principles of STM, an emerging new technique for materials analysis, are reviewed. The analysis of several films which received up to 5.8 years of low Earth orbital (LEO) exposure onboard the NASA Long Duration Exposure Facility (LDEF) is discussed. Specimens included FEP Teflon thermal blanket material, Kapton film, and several experimental polymer films. Ultraviolet and atomic oxygen-induced crazing and erosion are described. The intent of this paper is to demonstrate how STM is enhancing the understanding of LEO space environmental effects on polymer films. |
| NASA分類 | NONMETALLIC MATERIALS |
| レポートNO | 93A54378 |
| 権利 | Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/314175 |
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