| タイトル | Lumped elements characterize Q in dielectric resonators |
| 著者（英） | Hearn, Chase P. |
| 著者所属（英） | NASA Langley Research Center |
| 発行日 | 1993-04-01 |
| 言語 | eng |
| 内容記述 | It has been earlier observed (Podcameni et al., 1981) that, as the coupling factor between a microstrip-coupled dielectric resonator and the line becomes much larger than unity, the unloaded quality factor (Q) of the resonator decreases. In this paper it is shown that this effect can be explained using lumped-element models of the coupling line, when the dielectric resonator is either overcoupled or undercoupled to the line. |
| NASA分類 | ELECTRONICS AND ELECTRICAL ENGINEERING |
| レポートNO | 93A38675 |
| 権利 | Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/317430 |
|
