| タイトル | OSEE responses on D6AC steel due to sample preparation |
| 著者（英） | Yost, W. T.; Welch, C. S.; Abedin, M. N. |
| 著者所属（英） | NASA Langley Research Center |
| 発行日 | 1992-01-01
1992 |
| 言語 | eng |
| 内容記述 | A cleaning procedure and a contamination method developed at NASA Langley to contaminate sample surfaces with a certain thickness of HD-2 grease are demonstrated. Varying levels of contamination are obtained. Optically stimulated electron emission (OSEE) measurements were performed using the parallel electric field cell and the Pat scan device for clean and contaminated samples with a known amount of common contaminant. The OSEE response is found to be more sensitive for the clean sample than for the contaminated one. It is concluded that the OSEE measurements obtained using these techniques are sensitive to surface conditions and the contaminant thickness variations. It is also shown that the wavelength of illuminating light can have a profound effect on OSEE current levels. |
| NASA分類 | QUALITY ASSURANCE AND RELIABILITY |
| レポートNO | 93A19652 |
| 権利 | Copyright |
