| タイトル | X-ray focusing using microchannel plates |
| 著者（英） | Kaaret, P.; Glavinas, E.; Chen, A.; Geissbuehler, P. |
| 著者所属（英） | NASA Headquarters; NASA Goddard Space Flight Center |
| 発行日 | 1992-12-01 |
| 言語 | eng |
| 内容記述 | We present measurements of the X-ray focusing properties of square-pore microchannel plates (MCP's). Square-pore MCP's contain large numbers of closely packed optical surfaces, as required for grazing incidence X-ray optics. The surface of individual MCP channels has been measured and found to have high microroughness transverse to the channel axis and low microroughness parallel to the axis. The high frequency transverse roughness, on length scales greater than 400 nm, has a rms value of 5.9 nm and a Gaussian autocorrelation function with correlation length of 1.41 micron. We find that the geometric misalignments of the surfaces of different channels limit the angular resolution obtainable with current samples of MCP's to 7.1 arcmin. |
| NASA分類 | OPTICS |
| レポートNO | 93A17832 |
| 権利 | Copyright |
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