| タイトル | Analysis of SSME inspection imagery using AI approaches |
| 著者（英） | Finegan, Michael K., Jr.; Wee, W. G. |
| 著者所属（英） | NASA Headquarters |
| 発行日 | 1991-01-01
1991 |
| 言語 | eng |
| 内容記述 | The automated analysis of SSME injector assemblies has been investigated for the cases of LOX post surface defects and injector-baffle deterioration. Defects are isolated via 2D feature extraction from borescope and camera images; temporal-frequency transforms are then used to create a multiresolution set of feature vectors representing image contents. The potential flaws thus discriminated are then segmented and classified according to known categories. AI is applied in the form of a blackboard architecture that is controlled by a rule-based production system. |
| NASA分類 | QUALITY ASSURANCE AND RELIABILITY |
| レポートNO | 93A16403 |
| 権利 | Copyright |
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