| タイトル | Microelectronic Chips For Radiation-Dose Tests |
| 著者（英） | Lin, Yu-Sang; Buehler, Martin G.; Sokoloski, Martin M.; Ray, Kevin P. |
| 著者所属（英） | Jet Propulsion Lab., California Inst. of Tech. |
| 発行日 | 1993-09-01 |
| 言語 | eng |
| 内容記述 | Custom-made single-chip complementary metal-oxide semiconductor (CMOS) integrated circuit designed to reveal effects of ionizing radiation on itself and similar integrated circuits. Potential terrestrial use: safety-oriented monitoring of ionizing radiation at nuclear powerplants, nuclear-waste sites, and the like. |
| NASA分類 | ELECTRONIC COMPONENTS AND CIRCUITS |
| レポートNO | 93B10544
NPO-18720 |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/323258 |
