| タイトル | More About Laser Scanner Tests For Single-Event Upsets |
| 著者（英） | Kim, Quiesup; Edmonds, Larry D.; Zoutendyk, John A.; Schwartz, Harvey R. |
| 著者所属（英） | Jet Propulsion Lab., California Inst. of Tech. |
| 発行日 | 1993-01-01 |
| 言語 | eng |
| 内容記述 | Two reports describe preliminary theoretical and experimental studies based on method described in "Laser Scanner Tests For Single-Event Upsets" (NPO-18216). Laser-scan and heavy-ion data found correlated within factor of two. Method of testing for single-event upsets intended to overcome disadvantages of, complement, and/or substitute for more-expensive cyclotron-testing method, which does not provide spatial resolution. |
| NASA分類 | ELECTRONIC SYSTEMS |
| レポートNO | 93B10018
NPO-18494 |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/323784 |
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