タイトル | DC field emission studies on N[lc]b |
その他のタイトル | ニオブの直流電解放出の研究 |
著者(日) | Wang, T.; Reece, Charles; Sundelin, R. |
著者(英) | Wang, T.; Reece, Charles; Sundelin, R. |
著者所属(日) | T. Jefferson Natl. Accelerator Facility; T. Jefferson Natl. Accelerator Facility; T. Jefferson Natl. Accelerator Facility |
著者所属(英) | Thomas Jefferson National Accelerator Facility; Thomas Jefferson National Accelerator Facility; Thomas Jefferson National Accelerator Facility |
発行日 | 2003-06 |
刊行物名 | Proceedings of the 10th Workshop on RF Superconductivity, SRF2001 Proceedings of the 10th Workshop on RF Superconductivity, SRF2001 |
開始ページ | 264 |
終了ページ | 267 |
刊行年月日 | 2003-06 |
言語 | eng |
抄録 | The DC field emission studies in TJNAF aim to further explore the causes of field emission from Niobium surfaces and enhance the understanding of various preparation techniques for the purpose of improving field emission suppression. Field emitters on Nb samples are located by a DC field emission scanning apparatus in ultrahigh vacuum, then individually studied under SEM with EDS for characterization. Results at above 100 MV/m from samples prepared by BCP, and by electropolishing are presented and compared. |
キーワード | DC field emission; electropolishing; superconducting cavity resonator; EDS; SEM; BCP; vacuum arc; high pressure water rinse; machining process; research and development; contaminant; Nb; DC電界放出; 電解研磨; 超伝導空洞共振器; EDS; SEM; BCP; 真空放電; 高圧水リンス; 機械加工過程; 研究開発; 汚染物質; Nb |
資料種別 | Conference Paper |
SHI-NO | AA0046174046 |
レポートNO | KEK-Proceedings-2003-2 |
URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/32813 |