| タイトル | The albedos of Pluto and Charon - Wavelength dependence |
| 著者（英） | Fink, Uwe; Marcialis, Robert L.; Africano, John; Lebofsky, Larry A.; Tedesco, Edward F.; Disanti, Michael A. |
| 著者所属（英） | Jet Propulsion Lab., California Inst. of Tech.; NASA Headquarters; NASA Goddard Space Flight Center |
| 発行日 | 1992-04-01 |
| 言語 | eng |
| 内容記述 | The March 3, 1987 occultation of Charon by Pluto was monitored simultaneously with three telescopes. Each site covered a distinct wavelength interval with the total range spanning 0.44-2.4 microns. Observing the same event ensures an identical sun-Pluto-earth geometry for all three sites, and minimizes the assumptions which must be made to combine results. This spectrophotometry is used to derive the individual geometric albedos of Pluto and Charon over a factor of at least 5 in wavelength. Combining the results with those of Binzel (1988) improved (B - V) color estimates (on the 'Johnson Pluto' system) are obtained for the components of the system at rotational phase 0.75: (Pluto + Charon) = 0.843 +/- 0.006; Pluto alone = 0.866 +/- 0.007; and Charon alone = 0.702 +/- 0.010. |
| NASA分類 | LUNAR AND PLANETARY EXPLORATION |
| レポートNO | 92A29457 |
| 権利 | Copyright |
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