| タイトル | Technique for Determining the Viscosity and Electrical Conductivity of Semiconducting Liquids |
| 著者（英） | Zhu, S.; Su, C. H.; Lehoczky, S. L.; Lin, B.; Ban, H.; Li, C.; Curreri, Peter A.; Scripa, R. N.; Feth, S. |
| 著者所属（英） | NASA Marshall Space Flight Center |
| 発行日 | 2002-01-01 |
| 言語 | eng |
| 内容記述 | A novel apparatus for determining the viscosity and electrical conductivity of semiconducting liquids has been developed at NASA/MSFC. The apparatus is based on the transient torque technique and utilizes a 125 micrometer diameter quartz fiber as a torsion wire and a sensitive angular detector to measure the deflection angle of the crucible containing the liquid. A rotating flow is induced in the semiconducting melt by the application of a rotating magnetic field and measurement of the magnitude and transient behavior of the induced deflection angle allows the simultaneous determination of the viscosity and electrical conductivity of the melt. Measurements at room temperature and up to 900 C were made on high purity melts. |
| NASA分類 | Inorganic, Organic and Physical Chemistry |
| 権利 | No Copyright |
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