| タイトル | Remote In-Situ Quantitative Mineralogical Analysis Using XRD/XRF |
| 著者（英） | Sarrazin, P.; Blake, D. F.; Elliott, S. T.; Collins, S. A.; Bish, D.; Vaniman, D.; Chipera, S. |
| 著者所属（英） | NASA Ames Research Center |
| 発行日 | 2001-05-01 |
| 言語 | eng |
| 内容記述 | X-Ray Diffraction (XRD) is the most direct and accurate method for determining mineralogy. The CHEMIN XRD/XRF instrument has shown promising results on a variety of mineral and rock samples. Additional information is contained in the original extended abstract. |
| NASA分類 | Geophysics |
| 権利 | No Copyright |
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