タイトル | Correction of measurement by HP-G[lc]e detector for incident diagnostic X-ray photons |
その他のタイトル | HP-Ge検出器による入射治療用X線光子測定の補正 |
著者(日) | 越田 吉郎; 清水 幸三; 春日 敏夫 |
著者(英) | Koshida, Kichiro; Shimizu, Kozo; Kasuga, Toshio |
著者所属(日) | 金沢大学 医学部 保健学科; 金沢大学 医学部 保健学科; 金沢大学 医学部 保健学科 |
著者所属(英) | Kanazawa University Dept. of Radiological Technology, School of Health Sciences, Faculty of Medicine; Kanazawa University Dept. of Radiological Technology, School of Health Sciences, Faculty of Medicine; Kanazawa University Dept. of Radiological Technology, School of Health Sciences, Faculty of Medicine |
発行日 | 2000-08-08 |
刊行物名 | Proceedings of the Second International Workshop on EGS Proceedings of the Second International Workshop on EGS |
開始ページ | 235 |
終了ページ | 241 |
刊行年月日 | 2000-08-08 |
言語 | eng |
抄録 | It is necessary to obtain corrected X-ray spectra in order to produce diagnostic images and to evaluate exposure dose. In this study, the compensation of a spectra obtained using a high-purity germanium crystal was performed using Monte Carlo simulation code EGS4. The photon energy of the high-purity germanium crystal was consistent with manufacturer specifications. The stripping method was used to eliminate scattered radiation inside the high-purity germanium semiconductor detector. The HP-Ge detector was used to obtain an absorption spectrum, which includes a component of photon interaction in the HP-Ge crystal. The component of the spectrum, including Photo-Peak, sum-escape, K-escape and Compton escape, attributable to the interaction between the mono-energy state and high-purity germanium was obtained between 0 keV and the maximum energy of the X-ray tube using the Monte Carlo simulation code EGS4. The effect of scattered photons was successfully removed from the spectrum of photons emitted from the target of an X-ray Tube using this simulation code. It is important to apply this compensation in order to obtain correct spectra of incident photons inside the detector. |
キーワード | high purity Ge detector; diagnostic X ray; EGS4; Monte Carlo simulation; Compton effect; photopeak; energy spectrum; research and development; 高純度Ge検出器; 治療用X線; EGS4; モンテカルロシミュレーション; Compton効果; ホトピーク; エネルギースペクトル; 研究開発 |
資料種別 | Conference Paper |
SHI-NO | AA0029759028 |
レポートNO | KEK-Proceedings-2000-20 |
URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/33880 |