| タイトル | 0.4 Microns Spatial Resolution with 1 GHz (lambda = 30 cm) Evanescent Microwave Probe |
| 著者（英） | Su, D.-P.; Tabib-Azar, M.; Ponchak, George E.; LeClair, S. R.; Pohar, A. |
| 著者所属（英） | NASA Lewis Research Center |
| 発行日 | 1999-03-01 |
| 言語 | eng |
| 内容記述 | In this article we describe evanescent field imaging of material nonuniformities with a record resolution of 0.4 microns at 1 GHz (lambda(sub g)/750000), using a resonant stripline scanning microwave probe. A chemically etched tip is used as a point-like evanescent field emitter and a probe-sample distance modulation is employed to improve the signal-to-noise ratio. Images obtained by evanescent microwave probe, by optical microscope, and by scanning tunneling microscope are presented for comparison. Probe was calibrated to perform quantitative conductivity measurements. The principal factors affecting the ultimate resolution of evanescent microwave probe are also discussed. |
| NASA分類 | Instrumentation and Photography |
| 権利 | Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/341063 |
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