| タイトル | Measurements with the Chandra Flight Contamination Monitor |
| 著者（英） | Swartz, D. A.; Kolodziejczak, J. J.; Weisskopf, M. C.; ODell, S. L.; Tennant, A. F.; Elsner, R. E. |
| 著者所属（英） | NASA Marshall Space Flight Center |
| 発行日 | 2000-01-01 |
| 言語 | eng |
| 内容記述 | NASA's Chandra X-ray Observatory includes a Flight Contamination Monitor (FCM), a system of 16 radioactive calibration sources mounted to the inside of the Observatory's forward contamination cover. The purpose of the FCM is to verify the ground-to-orbit transfer of the Chandra flux scale, through comparison of data acquired during the ground calibration with those obtained in orbit, immediately prior to opening the Observatory's sun-shade door. Here we report results of these measurements, which place limits on the change in mirror-detector system response and, hence, on any accumulation of molecular contamination on the mirrors' iridium-coated surfaces. |
| NASA分類 | Astronomy |
| 権利 | No Copyright |
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