| タイトル | Superpolishing and Precision Metrology on a Metal Mandrel and Replicated Segments for Constellation-X |
| 著者（英） | Petre, R.; Content, D.; Saha, T.; Zaniewski, J.; Chan, K. W.; Wright, G.; Lyons, J. J., III |
| 著者所属（英） | NASA Goddard Space Flight Center |
| 発行日 | 1999-05-20 |
| 言語 | eng |
| 内容記述 | We have superpolished a diamond-turned aluminum mandrel (coated with electroless Ni) to an axial roughness of 0.34 nm rms. The mandrel is made to the Astro-E secondary mirror design for the 81st shell. Precision metrology at 100 mm to submicron scales has established the power spectral density of the mandrel and ultralightweight gold coated replicated segments. Predicted image quality of a set of optimally aligned replicated segments of this and a matching primary is substantially improved as compared to the flight mirrors for Astro-E. This approach using metal mandrels, superpolishing, and replicated ultralightweight foil mirrors, may represent a cost-effective approach to meeting the 15 arcsec half-energy width and weight requirements for the Constellation-X mission. Descriptions of the polishing apparatus, the precision metrology instruments, and the surface data analysis are presented. The general methods described are applicable to precision optics for both normal incidence and grazing incidence optics. |
| NASA分類 | Engineering (General) |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/342437 |
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