| タイトル | Determination of the Wetting Angle of Germanium and Germanium-Silicon Melts on Different Substrate Materials |
| 著者（英） | Cobb. S. D.; Kaiser, Natalie; Szofran, F. R.; Benz, K. W.; Dold, P.; Croell, Arne |
| 著者所属（英） | NASA Marshall Space Flight Center |
| 発行日 | 1999-01-01 |
| 言語 | eng |
| 内容記述 | During Bridgman growth of semiconductors detachment of the crystal and the melt meniscus has occasionally been observed, mainly under microgravity (microg) conditions. An important factor for detached growth is the wetting angle of the melt with the crucible material. High contact angles are more likely to result in detachment of the growing crystal from the ampoule wall. In order to achieve detached growth of germanium (Ge) and germanium-silicon (GeSi) crystals under 1g and microg conditions, sessile drop measurements were performed to determine the most suitable ampoule material as well as temperature dependence of the surface tension for GeSi. Sapphire, fused quartz, glassy carbon, graphite, SiC, pyrolytic Boron Nitride (pBN), AIN, and diamond were used as substrates. Furthermore, different cleaning procedures and surface treatments (etching, sandblasting, etc.) of the same substrate material and their effect on the wetting behavior were studied during these experiments. pBN and AIN substrates exhibited the highest contact angles with values around 170 deg. |
| NASA分類 | Solid-State Physics |
| 権利 | No Copyright |
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