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タイトルAXAF-I Low Intensity-Low Temperature (LILT) Testing of the Development Verification Test (DVT) Solar Panel
著者(英)Edge, Ted; Willowby, Doug; Alexander, Doug
著者所属(英)NASA Marshall Space Flight Center
発行日1998-01-01
言語eng
内容記述The planned orbit of the AXAF-I spacecraft will subject the spacecraft to both short, less than 30 minutes for solar and less than 2 hours for lunar, and long earth eclipses and lunar eclipses with combined conjunctive duration of up to 3 to 4 hours. Lack of proper Electrical Power System (EPS) conditioning prior to eclipse may cause loss of mission. To avoid this problem, for short eclipses, it is necessary to off-point the solar array prior to or at the beginning of the eclipse to reduce the battery state of charge (SOC). This yields less overcharge during the high charge currents at sun entry. For long lunar eclipses, solar array pointing and load scheduling must be tailored for the profile of the eclipse. The battery SOC, loads, and solar array current-voltage (I-V) must be known or predictable to maintain the bus voltage within acceptable range. To address engineering concerns about the electrical performance of the AXAF-I solar array under Low Intensity and Low Temperature (LILT) conditions, Marshall Space Flight Center (MSFC) engineers undertook special testing of the AXAF-I Development Verification Test (DVT) solar panel in September-November 1997. In the test the DVT test panel was installed in a thermal vacuum chamber with a large view window with a mechanical "flapper door". The DVT test panel was "flash" tested with a Large Area Pulse Solar Simulator (LAPSS) at various fractional sun intensities and panel (solar cell) temperatures. The testing was unique with regards to the large size of the test article and type of testing performed. The test setup, results, and lessons learned from the testing will be presented.
NASA分類Energy Production and Conversion
権利No Copyright


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