| タイトル | To the Die Smartly: Heavy Ion Testing of PEMs on COTS Boards Through the Plastic |
| 著者（英） | Wode, G.; Wert, J. L.; Fisher, E.; Blumer, J.; Stevens, L.; Normand, E.; Oberg, D. L. |
| 著者所属（英） | Boeing Defense and Space Group |
| 発行日 | 1999-01-01
1999 |
| 言語 | eng |
| 内容記述 | Seven commercial off the shelf (COTS) boards containing electronic devices (all in plastic packages, PEMS), under consideration for use in a spacecraft subsystem, were exposed to beams of very high energy ions at the National Superconducting Cyclotron Laboratory (MSU). The ion energies were high enough that an entire board could be exposed in air, and it could still penetrate through the plastic and reach the silicon die. A total of about 300 runs were made, and for each, the LET of the ion entering the silicon die had to be determined, based on the thickness of the plastic lid and the thickness of overlaying materials (e.g., aluminum degraders). Single event latchup (SEL) and functional interrupt (SEFI) were determined during each run, the SEFI by means of simple programs being continuously written to and read from the boards to monitor functionality, while each part was being exposed to the heavy ions. |
| NASA分類 | Nuclear and High-Energy Physics |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/343610 |
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