| タイトル | Measurement of surface microtopography |
| 著者（英） | Lewis, P.; Farr, T. G.; Leberl, F. W.; Muller, J.-P.; Wall, S. D. |
| 著者所属（英） | University Coll.|Vexcel Corp.|Jet Propulsion Lab., California Inst. of Tech. |
| 発行日 | 1991-08-01 |
| 言語 | eng |
| 内容記述 | Acquisition of ground truth data for use in microwave interaction modeling requires measurement of surface roughness sampled at intervals comparable to a fraction of the microwave wavelength and extensive enough to adequately represent the statistics of a surface unit. Sub-centimetric measurement accuracy is thus required over large areas, and existing techniques are usually inadequate. A technique is discussed for acquiring the necessary photogrammetric data using twin film cameras mounted on a helicopter. In an attempt to eliminate tedious data reduction, an automated technique was applied to the helicopter photographs, and results were compared to those produced by conventional stereogrammetry. Derived root-mean-square (RMS) roughness for the same stereo-pair was 7.5 cm for the automated technique versus 6.5 cm for the manual method. The principal source of error is probably due to vegetation in the scene, which affects the automated technique but is ignored by a human operator. |
| NASA分類 | EARTH RESOURCES AND REMOTE SENSING |
| レポートNO | 91A47233 |
| 権利 | Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/346508 |
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