| タイトル | Thin-film power-density meter for millimeter wavelengths |
| 著者（英） | Lee, Karen A.; Guo, Yong; Chiao, Jung-Chih; Potter, Kent A.; Stimson, Philip A. |
| 著者所属（英） | California Inst. of Tech. |
| 発行日 | 1991-03-01 |
| 言語 | eng |
| 内容記述 | A quasi-optical power density meter for millimeter and submillimeter wavelengths has been developed. The device is a 2-cm2 thin-film bismuth bolometer deposited on a mylar membrane. The resistance responsivity is 150 Ohms/W, and the time constant is 1 min. The meter is calibrated at DC. The bolometer is much thinner than a wavelength, and can thus be modeled as a lumped resistance in a transmission-line equivalent circuit. The absorption coefficient is 0.5 for 189-Ohms/square film. The power-density meter has been used to measure absolute power densities for millimeter-wave antenna efficiency measurements. Absolute power densities of 0.5 mW/sq cm have been measured to an estimated accuracy of 5 percent. |
| NASA分類 | INSTRUMENTATION AND PHOTOGRAPHY |
| レポートNO | 91A35887 |
| 権利 | Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/348471 |
