| タイトル | Advances in the development of encapsulants for mercuric iodide X-ray detectors |
| 著者（英） | Iwanczyk, J. S.; Bradley, J. G.; Albee, A. L.; Schnepple, W. F.; Wang, Y. J. |
| 著者所属（英） | California Inst. of Tech.|Jet Propulsion Lab., California Inst. of Tech.|XSIRIUS Scientific, Inc. |
| 発行日 | 1990-12-01 |
| 言語 | eng |
| 内容記述 | Advances in the development of protective impermeable encapsulants with high transparency to ultra-low-energy X-rays for use on HgI2 X-ray detectors are reported. Various X-ray fluorescence spectra from coated detectors are presented. The X-ray absorption in the encapsulants has been analyzed using characteristic radiation from various elements. Results suggest that low-energy cutoffs for the detectors are not determined solely by the encapsulating coatings presently employed but are also influenced by the front electrode and surface effects, which can affect the local electric field or the surface recombination velocity. An energy resolution of 182 eV (FWHM) has been achieved for Ni L lines at 850 eV. Improved detector sensitivity to X-ray energies under 700 eV is demonstrated. |
| NASA分類 | INSTRUMENTATION AND PHOTOGRAPHY |
| レポートNO | 91A23082 |
| 権利 | Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/350403 |
