| タイトル | Advanced CCD imager technology for use from 1 to 10,000 A |
| 著者（英） | Mcgonagle, W. H.; Reich, R. K.; Twichell, J. C.; Huang, C. M.; Burke, B. E. |
| 著者所属（英） | Massachusetts Inst. of Tech. |
| 発行日 | 1990-10-01 |
| 言語 | eng |
| 内容記述 | A low-noise, high-sensitivity charge-coupled-device (CCD) technology for imaging applications extending from the soft X-ray (1 A) to the near-infrared (10,000 A) regimes was developed together with a fabrication technology for making back-illuminated versions of these devices with quantum efficiencies as high as 90 percent from 5000 to 7000 A. The efforts have focused on two devices, a 64 x 64 pixel back-illuminated imager with two output ports that operates at 2000 frames per second with 23 electrons read noise, and a larger device, with 420 x 420 pixel format, designed for lower frame rates with noise as low as 1.5 electrons and used at visible, UV, and X-ray wavelengths. Applications to plasma diagnostics include Thomson scattering and high-frame-rate imaging in the visible, as well as X-ray imaging and bolometry. |
| NASA分類 | INSTRUMENTATION AND PHOTOGRAPHY |
| レポートNO | 91A12934 |
| 権利 | Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/352114 |
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