| タイトル | Designing Accelerated Tests Of Electromigration |
| 著者（英） | Buehler, Martin G. |
| 著者所属（英） | Jet Propulsion Lab., California Inst. of Tech. |
| 発行日 | 1991-08-01 |
| 言語 | eng |
| 内容記述 | Method for design of accelerated tests of electromigration (as in microscopic conductors in integrated circuits) based partly on simplified mathematical model of electromigration and partly on error analysis. Objective to determine quickly operating life of tested components under normal operating conditions by extrapolation from lifetime measurements at operating stresses greater than normal. Involves compromise between reducing testing time by increasing stresses and reducing uncertainty in extrapolated lifetime by decreasing stresses. |
| NASA分類 | PHYSICAL SCIENCES |
| レポートNO | 91B10377
NPO-18012 |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/352958 |
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