| タイトル | FTIR Spectroscopic Characterization Of II-VI Semiconductors |
| 著者（英） | Szofran, F. R.; Perry, G. L. E. |
| 著者所属（英） | NASA Marshall Space Flight Center |
| 発行日 | 1991-04-01 |
| 言語 | eng |
| 内容記述 | Combination of commercial Fourier-transform infrared (FTIR) spectrometer with computer and special-purpose software constitutes highly automated facility for acquisition and processing of infrared transmission or reflection spectral image data. Intended principally to acquire transmission spectra of some compounds of elements in groups II and VI of periodic table. System used to characterize specimens of II/VI alloy semiconductors grown by directional solidification and quenching. Transmission-edge maps helpful in studies of flows, gradients of temperature, and coefficients of diffusion in solidifying melts. Data acquired by system include optical characteristics, and they both verify and complement data obtained by such other techniques as measurements of density and x-ray-dispersion analysis. |
| NASA分類 | PHYSICAL SCIENCES |
| レポートNO | 91B10145
MFS-27234 |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/353190 |
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