| タイトル | Practical application of HgI2 detectors to a space-flight scanning electron microscope |
| 著者（英） | Albee, A. L.; Dabrowski, A. J.; Conley, J. M.; Iwanczyk, J. S.; Bradley, J. G. |
| 著者所属（英） | Jet Propulsion Lab., California Inst. of Tech.|California Inst. of Tech.|University of Southern California |
| 発行日 | 1989-01-01 |
| 言語 | eng |
| 内容記述 | Mercuric iodide X-ray detectors have been undergoing tests in a prototype scanning electron microscope system being developed for unmanned space flight. The detector program addresses the issues of geometric configuration in the SEM, compact packaging that includes separate thermoelectric coolers for the detector and FET, X-ray transparent hermetic encapsulation and electrical contacts, and a clean vacuum environment. |
| NASA分類 | INSTRUMENTATION AND PHOTOGRAPHY |
| レポートNO | 90A27400 |
| 権利 | Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/357555 |
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