| タイトル | X-ray diffraction measurements of residual stresses in SiC/Ti composites |
| 著者（英） | Hendricks, R. W.; Brewer, W. D.; Brown, K. M. |
| 著者所属（英） | Virginia Polytechnic Inst. and State Univ.; NASA Langley Research Center |
| 発行日 | 1989-10-01 |
| 言語 | eng |
| 内容記述 | Residual stresses are developed in metal matrix composites during consolidation because of the difference in the coefficient of thermal expansion of the fiber and matrix constituents. X-ray diffraction techniques were used to measure tensile residual stresses in the matrix component of two different titanium alloy composites reinforced with continuous silicon carbide fibers. The titanium alloy matrices were a beta-stabilized alloy Ti-15V-3Al-3Cr-3Sn, and an ordered multiphase (alpha + beta) alloy, Ti-14Al-21Nb. Residual tensile stresses as high as 62 percent of the yield of Ti-15V-3Al-3Cr-3Sn and 70 percent of the yield of Ti-14Al-21Nb were measured in the longitudinal direction on unidirectionally reinforced composites. By measuring residual stresses in four different composite lay-ups, the composite lay-up was determined to have a significant effect on the residual stress state near the surface. |
| NASA分類 | COMPOSITE MATERIALS |
| レポートNO | 90A21932 |
| 権利 | Copyright |
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