| タイトル | Ellipsometric method for the measurement of temperature and optical constants of incandescent transition metals |
| 著者（英） | Margrave, John L.; Hauge, Robert H.; Krishnan, Shankar; Hansen, George P. |
| 著者所属（英） | Intersonics, Inc.|Rice Univ.|Texas Research Inst., Inc. |
| 発行日 | 1989-05-15 |
| 言語 | eng |
| 内容記述 | The development of a unique noncontact temperature measurement device utilizing rotating analyzer ellipsometry is described. The technique circumvents the necessity of spectral emissivity estimation by direct measurement concomitant with radiance brightness. Simultaneous determinations of dielectric constants and refractive indices allow changes in the physical and chemical state of a heated surface to be monitored. The results of optical property measurements at 633 nm as functions of temperature between 1000 and 2500 K for eight transition metals including Hf, Ir, Mo, Nb, Pd, Pt, Ta, and V are presented together with preliminary results of oxidation studies on iridium. |
| NASA分類 | INSTRUMENTATION AND PHOTOGRAPHY |
| レポートNO | 89A41945 |
| 権利 | Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/363078 |
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