| タイトル | Synchrotron radiation calibration of the EUVE variable line-spaced diffraction gratings at the NBS SURF II facility |
| 著者（英） | Jelinsky, P.; Jelinsky, S. R.; Vallerga, J.; Miller, A.; Malina, R. F. |
| 著者所属（英） | California Univ. |
| 発行日 | 1988-01-01 |
| 言語 | eng |
| 内容記述 | The Extreme Ultraviolet Explorer (EUVE) has a spectrometer which utilizes variable line-spaced, plane diffraction gratings in the converging beam of a Wolter-Schwarzschild type II mirror. The gratings, microchannel plate detector, and thin film filters have been calibrated with continuum radiation provided by the NBS SURF II facility. These were calibrated in a continuum beam to find edges or other sharp spectral features in the transmission of the filters, quantum efficiency of the microchannel plate detector, and efficiency of the gratings. The details of the calibration procedure and the results of the calibration are presented. |
| NASA分類 | INSTRUMENTATION AND PHOTOGRAPHY |
| レポートNO | 89A40311 |
| 権利 | Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/363308 |
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