| タイトル | Fano-noise-limited CCDs |
| 著者（英） | Bredthauer, Richard; Janesick, James; Chandler, Charles; Elliott, Tom; Burke, Barry |
| 著者所属（英） | Massachusetts Inst. of Tech.|Jet Propulsion Lab., California Inst. of Tech.|Ford Aerospace and Communications Corp. |
| 発行日 | 1988-01-01 |
| 言語 | eng |
| 内容記述 | Recent developments of scientific CCDs have produced sensors that achieve ultra low read noise performance (less than 2 electrons rms) and near perfect charge transfer efficiency (0.9999996) without the addition of a fat-zero. This progress has now made it possible to achieve Fano-noise-limited performance in the soft X-ray where the detector's energy resolution is primarily limited by the statistical variation in the charge generated by the interacting X-ray photon. In this paper, Fano-noise-limited test data is presented for two different CCD types and a CCD derived estimate of the Fano factor is determined. By evaluating ultra low-modulation images (less than 1 electron peak-to-peak) it is shown that the CCD's global CTE is now superior to its read noise floor. To capitalize on this capability CCD manufacturers are now focusing their attention on reducing the noise floor below the 1 electron level thereby matching the sensor's CTE performance. This improvement, if accomplished, will push Fano-noise-limited performance for the CCD into the extreme ultra-violet. |
| NASA分類 | INSTRUMENTATION AND PHOTOGRAPHY |
| レポートNO | 89A40284 |
| 権利 | Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/363321 |
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