| タイトル | Trends In Susceptibility To Single-Event Upset |
| 著者（英） | Blandford, James T.; Pickel, James C.; Waskiewicz, Alvin E.; Nichols, Donald K.; Price, William E.; Koga, Rukotaro; Kolasinski, Wojciech A. |
| 著者所属（英） | Jet Propulsion Lab., California Inst. of Tech. |
| 発行日 | 1989-01-01 |
| 言語 | eng |
| 内容記述 | Report provides nearly comprehensive body of data on single-event upsets due to irradiation by heavy ions. Combines new test data and previously published data from governmental and industrial laboratories. Clear trends emerge from data useful in predicting future performances of devices. |
| NASA分類 | ELECTRONIC COMPONENTS AND CIRCUITS |
| レポートNO | 89B10009
NPO-17147 |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/368453 |
