| タイトル | RF Testing Of Microwave Integrated Circuits |
| 著者（英） | Ponchak, G. E.; Shalkhauser, K. A.; Romanofsky, R. R.; Bhasin, K. B. |
| 著者所属（英） | NASA Lewis Research Center |
| 発行日 | 1988-07-01 |
| 言語 | eng |
| 内容記述 | Fixtures and techniques are undergoing development. Four test fixtures and two advanced techniques developed in continuing efforts to improve RF characterization of MMIC's. Finline/waveguide test fixture developed to test submodules of 30-GHz monolithic receiver. Universal commercially-manufactured coaxial test fixture modified to enable characterization of various microwave solid-state devices in frequency range of 26.5 to 40 GHz. Probe/waveguide fixture is compact, simple, and designed for non destructive testing of large number of MMIC's. Nondestructive-testing fixture includes cosine-tapered ridge, to match impedance wavequide to microstrip. Advanced technique is microwave-wafer probing. Second advanced technique is electro-optical sampling. |
| NASA分類 | ELECTRONIC COMPONENTS AND CIRCUITS |
| レポートNO | 88B10359
LEW-14639 |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/375151 |
