| タイトル | Synchrotron radiation monitor for KEK B-factory |
| その他のタイトル | KEKBファクトリーのためのシンクロトロン放射モニター |
| 著者（日） | 三橋 利行; Flanagan, John W.; 平松 成範 |
| 著者（英） | Mitsuhashi, Toshiyuki; Flanagan, John W.; Hiramatsu, Shigenori |
| 著者所属（日） | 高エネルギー加速器研究機構; 高エネルギー加速器研究機構; 高エネルギー加速器研究機構 |
| 著者所属（英） | High Energy Accelerator Research Organization; High Energy Accelerator Research Organization; High Energy Accelerator Research Organization |
| 発行日 | 2000-02 |
| 刊行物名 | Proceedings of International Workshop on Performance Improvement of Electron-Positron Collider Particle Factories: e(+)e(-) Factories 1999
Proceedings of International Workshop on Performance Improvement of Electron-Positron Collider Particle Factories: e(+)e(-) Factories 1999 |
| 開始ページ | 134 |
| 終了ページ | 138 |
| 刊行年月日 | 2000-02 |
| 言語 | eng |
| 抄録 | A synchrotron radiation (SR) monitor for KEK B-factory has been designed and constructed. The monitor consists of the following systems: 1) visible SR beam extraction system having a real time surface flatness measurement system, 2) SR beam relay system, 3) focusing system for the observation of the beam profile, 4) SR-interferometer for the measurement of the beam size, and 5) extra branch beamline for other measurement such as streak camera. The beam sizes for both X and Y directions are measured automatically by the use of SR interferometers. |
| キーワード | KEKB; synchrotron radiation monitor; interferometer; X ray; streak camera; bunch length; systems engineering; KEKB; シンクロトロン放射モニター; 干渉計; X線; ストリークカメラ; バンチ長; システムエンジニアリング |
| 資料種別 | Conference Paper |
| SHI-NO | AA0032165024 |
| レポートNO | KEK-Proceedings-99-24 |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/38018 |
