| タイトル | Quantitative thermal characterization of thin plates |
| 著者（英） | Winfree, W. P.; Welch, C. S.; Heath, D. M. |
| 著者所属（英） | College of William and Mary|NASA Langley Research Center |
| 発行日 | 1986-01-01 |
| 言語 | eng |
| 内容記述 | The principles of quantitative thermal testing of the mechanical integrity of platelike structures are discussed. In this technique, a scanned laser pulse is used to inject a thermal pattern in a sample, and a thermal IR imager is used to document the evolution of the pattern subsequent to injection. The measurements are remote, noncontacting, and one-sided, and the algorithms used to obtain diffusivity are all emissivity-independent. The results yielded by application of the three analytical techniques, used to obtain diffusivity values from the image data on stainless steel, a graphite-epoxy composite, brass, and aluminum 2024 samples, are presented. |
| NASA分類 | QUALITY ASSURANCE AND RELIABILITY |
| レポートNO | 87A10751 |
| 権利 | Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/381974 |
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