| タイトル | Screening Mechanically-Defective Solar Cells |
| 著者（英） | Leipold, M. H.; Chen, C. P. |
| 著者所属（英） | Jet Propulsion Lab., California Inst. of Tech. |
| 発行日 | 1987-01-01 |
| 言語 | eng |
| 内容記述 | Flexure test eliminates failure-prone wafers before further processing. Probability of cracking of silicon solar cells substantially reduced by mechanical proof testing of silicon wafers before further processing, according to report. Report based on study demonstrating weak wafers eliminated by subjecting all wafers in manufacturing batch to biaxial-flexure test. |
| NASA分類 | MATERIALS |
| レポートNO | 87B10016
NPO-16573 |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/382645 |
