| タイトル | Inverse methods in rough-surface scattering |
| 著者（英） | Fung, A. K. |
| 著者所属（英） | Kansas Univ. Center for Research, Inc. |
| 発行日 | 1985-01-01 |
| 言語 | eng |
| 内容記述 | For the case of unknown surfaces, which can only be studied by means of remote sensors, roughness scale relative to incident wavelength can be determined through the examination of angular scattering characteristics in both vertically and horizontally polarized states. Generally, an angular backscattering curve without polarization dependence indicates scattering by roughness scales that are larger than the incident wavelength. Over angular regions where both vertical and horizontal returns are well separated, the scattering must be dominated by roughness scales that are small by comparison with wavelength. |
| NASA分類 | PHYSICS (GENERAL) |
| レポートNO | 85A48971 |
| 権利 | Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/389588 |
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