タイトル | Studying Crystal Growth With the Peltier Effect |
著者(英) | Silberstein, R. P.; Dressler, B.; Larsen, David J., Jr.; Poit, W. J. |
著者所属(英) | NASA Marshall Space Flight Center |
発行日 | 1986-01-01 |
言語 | eng |
内容記述 | Peltier interface demarcation (PID) shown useful as aid in studying heat and mass transfer during growth of crystals from molten material. In PID, two dissimilar "metals" solid and liquid phases of same material. Current pulse passed through unidirectionally solidifying sample to create rapid Peltier thermal disturbance at liquid/solid interface. Disturbance, measured by thermocouple stationed along path of solidification at or near interface, provides information about position and shape of interface. |
NASA分類 | MATERIALS |
レポートNO | 85B10346 MFS-28041 |
権利 | No Copyright |
URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/395706 |
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