| タイトル | Development of a miniature scanning electron microscope for in-flight analysis of comet dust |
| 著者（英） | Albee, A. L.; Tomassian, A. D.; Giffin, C. E.; Bradley, J. G.; Conley, J. M. |
| 著者所属（英） | Jet Propulsion Lab., California Inst. of Tech.|Perkin-Elmer Corp. |
| 発行日 | 1983-01-01 |
| 言語 | eng |
| 内容記述 | A description is presented of an instrument which was developed with the original goal of being flown on the International Comet Mission, scheduled for a 1985 launch. The Scanning Electron Microscope and Particle Analyzer (SEMPA) electron miniprobe is a miniaturized electrostatically focused electron microscope and energy dispersive X-ray analyzer for in-flight analysis of comet dust particles. It was designed to be flown on board a comet rendezvous spacecraft. Other potential applications are related to asteroid rendezvous and planetary lander missions. According to the development objectives, SEMPA miniprobe is to have the capability for imaging and elemental analysis of particles in the size range of 0.25 microns and larger. |
| NASA分類 | SPACECRAFT INSTRUMENTATION |
| レポートNO | 84A22867 |
| 権利 | Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/399528 |
